1.1”This practice covers recommended procedures for the use of dosimeters, such as thermoluminescent dosimeters (TLD’s), to determine the absorbed dose in a region of interest within an electronic device irradiated using a Co-60 source. Co-60 sources are commonly used for the absorbed dose testing of silicon electronic devices.
Note 1:”This absorbed-dose testing is sometimes called ”’total dose testing”’ to distinguish it from ”’dose rate testing.”’
Note 2:”The effects of ionizing radiation on some types of electronic devices may depend on both the absorbed dose and the absorbed dose rate; that is, the effects may be different if the device is irradiated to the same absorbed-dose level at different absorbed-dose rates. Absorbed-dose rate effects are not covered in this practice but should be considered in radiation hardness testing.
Product Details
- Published:
- 02/01/2021
- Number of Pages:
- 17
- File Size:
- 1 file , 500 KB
