1.1 This test method covers the determination of the presence of surface flaws in tungsten-seal rod and wire of random or cut lengths, and in the tungsten section of multiple-piece-through leads used in electronic devices, by means of examination of a glass bead sealed to the tungsten.
Product Details
- Published:
- 05/01/2013
- Number of Pages:
- 2
- File Size:
- 1 file , 50 KB
