Click here to purchase

1.1 This test method covers determination of ductility utilizing Epstein test strips and a bending device for bending the strip over a predetermined radius. It is intended for commercial silicon-bearing steel sheet or strip of nonoriented types in the thickness range from 0.010 to 0.031 in. [0.25 to 0.79 mm], inclusive.

Product Details

Published:
04/01/2016
Number of Pages:
2
File Size:
1 file , 79 KB