1.1 This test method provides a procedure for measuring the electromagnetic (EM) shielding effectiveness (SE) of a planar material for a plane, far-field EM wave. From the measured data, near-field SE values can be calculated for magnetic (H) sources for electrically thin specimens.2,3 Electric (E) field SE values are also able to be calculated from this same far-field data, but their validity and applicability have not been established.
Product Details
- Published:
- 05/01/2018
- Number of Pages:
- 11
- File Size:
- 1 file , 580 KB
- Redline File Size:
- 2 files , 1.3 MB
