1.1 This test method covers the measurement of dry film thickness (DFT) of coating films by microscopic observation of a precision-cut, shallow-angle crater bored into the coating film. This crater reveals cross sectional layers appearing as rings, whose width is proportional to the depth of the coating layer(s) and allows for direct calculation of dry film thickness.
1.1.1 The Apparatus, Procedure, and Precision and Bias discussions include Method A and Method B. Method A involves the use of an optical measurement apparatus which is no longer commercially available, but remains a valid method of dry film measurement. Method B is a software driven measurement procedure that supersedes Method A.
Product Details
- Published:
- 06/01/2015
- Number of Pages:
- 5
- File Size:
- 1 file , 170 KB
