1.1 This practice covers recommended procedures for the use of dosimeters, such as thermoluminescent dosimeters (TLD’s), to determine the absorbed dose in a region of interest within an electronic device irradiated using a Co-60 source. Co-60 sources are commonly used for the absorbed dose testing of silicon electronic devices.
Note 1: This absorbed-dose testing is sometimes called “total dose testing” to distinguish it from “dose rate testing.”
Note 2: The effects of ionizing radiation on some types of electronic devices may depend on both the absorbed dose and the absorbed dose rate; that is, the effects may be different if the device is irradiated to the same absorbed-dose level at different absorbed-dose rates. Absorbed-dose rate effects are not covered in this practice but should be considered in radiation hardness testing.
Product Details
- Published:
- 06/01/2015
- Number of Pages:
- 17
- File Size:
- 1 file , 500 KB
- Redline File Size:
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