1.1 This guide provides the SIMS analyst with a method for determining the width of interfaces from SIMS sputtering data obtained from analyses of layered specimens (both organic and inorganic). This guide does not apply to data obtained from analyses of specimens with thin markers or specimens without interfaces such as ion-implanted specimens.
Product Details
- Published:
- 11/01/2019
- Number of Pages:
- 3
- File Size:
- 1 file , 82 KB
