1.1 This method describes the analysis of titanium and titanium alloys by ICP-AES (Inductively Coupled Plasma) and DCP-AES (Direct Current Plasma) for the following elements:
| Element | ApplicationRange (wt.%) | QuantitativeRange (wt.%) |
| Aluminum | 0-8 | 0.001 to 8.0 |
| Boron | 0-0.04 | 0.0008 to 0.01 |
| Chromium | 0-5 | 0.005 to 4.0 |
| Copper | 0-0.6 | 0.002 to 0.5 |
| Iron | 0-3 | 0.004 to 3.0 |
| Manganese | 0-0.04 | 0.001 to 0.01 |
| Molybdenum | 0-8 | 0.004 to 6.0 |
| Nickel | 0-1 | 0.001 to 1.0 |
| Silicon | 0-0.5 | 0.02 to 0.4 |
| Tin | 0-4 | 0.02 to 3.0 |
| Vanadium | 0-15 | 0.01 to 15.0 |
| Yttrium | 0-0.04 | 0.001 to 0.004 |
| Zirconium | 0-5 | 0.003 to 4.0 |
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific safety hazards statements are given in Section 9.
Product Details
- Published:
- 06/01/2004
- Number of Pages:
- 13
- File Size:
- 1 file , 65 KB
