1.1 This test method describes a highly accurate technique for measuring the normal spectral emittance of electrically conducting materials or materials with electrically conducting substrates, in the temperature range from 600 to 1400 K, and at wavelengths from 1 to 35 μm.
Product Details
- Published:
- 04/01/2014
- Number of Pages:
- 6
- File Size:
- 1 file , 86 KB
