1.1 This guide covers procedures for determining the energy-differential fluence spectra of neutrons used in radiation-hardness testing of electronic semiconductor devices. The types of neutron sources specifically covered by this guide are fission or degraded energy fission sources used in either a steady-state or pulse mode.
Product Details
- Published:
- 12/01/2016
- Number of Pages:
- 12
- File Size:
- 1 file , 170 KB
- Redline File Size:
- 2 files , 340 KB
