1.1”This guide covers procedures for determining the energy-differential fluence spectra of neutrons used in radiation-hardness testing of electronic semiconductor devices. The types of neutron sources specifically covered by this guide are fission or degraded energy fission sources used in either a steady-state or pulse mode.
Product Details
- Published:
- 07/01/2022
- Number of Pages:
- 12
- File Size:
- 1 file , 170 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
