1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 10³ Gy (matl.)/s.
1.1.1 Discussion-This document is intended to be a guide to determine upset threshold, and is not intended to be a stand-alone document.
Product Details
- Published:
- 06/01/2014
- Number of Pages:
- 6
- File Size:
- 1 file , 89 KB
- Redline File Size:
- 2 files , 170 KB
