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1.1 This guide covers recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having 10 keV mean photon energy and 50 keV maximum energy) in testing semiconductor discrete devices and integrated circuits for effects from ionizing radiation.

Product Details

Published:
03/01/2018
Number of Pages:
18
File Size:
1 file , 400 KB
Redline File Size:
2 files , 810 KB