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This document describes backend-level test and data methods for the qualification of semiconductor technologies. It does not give pass or fail values or recommend specific test equipment, test structures or test algorithms. Wherever possible, it references applicable JEDEC such as JESD47 or other widely accepted standards for requirements documentation.
Product Details
- Published:
- 09/01/2018
- Number of Pages:
- 26
- File Size:
- 1 file , 430 KB
