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Describes the method of a typical oscilloscope waveform and the basic test circuit employed in the measurement of turn off loss for bipolar, IGBT and MOSFET power semiconductors. This method can be used as a standard for evaluating power semiconductor turn-off switching loss capability and defines standard terminology that should be referenced within the electronic industry.
Product Details
- Published:
- 10/01/1989
- Number of Pages:
- 12
- File Size:
- 1 file , 230 KB
