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This standard describes the method to be used for the measurement of small-signal VHF-UHF transistor admittance parameters, in preparing data sheets for JEDEC registration of low power transistors. Formerly known as RS-372 and/or EIA-372.
Product Details
- Published:
- 05/01/1970
- Number of Pages:
- 13
- File Size:
- 1 file , 350 KB
