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The purpose of this report is to provide specific information on instrumentation and procedures to measure spark igniter tip semiconductor resistance at an applied voltage level of 500 to 1000 volts without introducing heating effects. This report describes a method of semiconductor resistance measurement using controlled energy levels and a digital processing oscilloscope to acquire and process test data.
Product Details
- Published:
- 06/01/1994
- File Size:
- 1 file , 200 KB
