This document describes the requirements of the following test methods for counterfeit detection of electronic components:
a. Method A: General External Visual Inspection (EVI), Sample Selection, and Handling
b. Method B: Detailed EVI
c. Method C: Testing for Remarking and Resurfacing
d. Method D: Surface Texture Analysis by SEM
NOTE: The scope of this document was focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other electronic components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide but additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types.
Product Details
- Published:
- 10/30/2016
- File Size:
- 1 file , 4.8 MB
