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SAE AS6171/2A describes the requirements of the following test methods for counterfeit detection of electronic components:
- Method A: General EVI, Sample Selection, and Handling
- Method B: Detailed EVI, including Part Weight measurement
- Method C: Testing for Remarking
- Method D: Testing for Resurfacing
- Method E: Part Dimensions measurement
- Method F: Surface Texture Analysis using SEM
The scope of this document is focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If AS6171/2 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
Product Details
- Published:
- 05/11/2017
- Number of Pages:
- 31
- File Size:
- 1 file , 8 MB
- Redline File Size:
- 2 files , 12 MB
